Barcelona, Spain
May 5, 2026 - May 7, 2026
Lyon, France
October 14, 2026 - October 15, 2026
Madrid, Spain
November 4, 2026 - November 5, 2026
Recorded webinar
Whether you need to get a complete coverage of your part while scanning, or simply reach measurements that are beyond the range of your device, combining data from multiple part/device setups is a common task for metrologists. PolyWorks|Inspector™ offers a complete set of tools to efficiently and accurately combine data acquired from multiple device positions.